<図書>
McGraw-Hill series in software engineering and technology
データ種別 | 図書 |
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出版者 | New York ; Tokyo : McGraw-Hill |
子書誌情報を非表示
1 | Software reliability : measurement, prediction, application / John D. Musa, Anthony Iannino, Kazuhira Okumoto : pbk. - New York : McGraw-Hill , c1987 |
書誌詳細を表示
書誌ID | 1000003202 |
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NCID | BA00143260 |