＜図書＞
Practical methods in electron microscopy / edited by Audrey M. Glauert
| データ種別 | 図書 |
|---|---|
| 出版者 | Amsterdam ; New York : North-Holland |
| 出版者 | New York, N.Y., U.S.A : Sole distributors for the USA and Canada, Elsevier Science |
| 大きさ | v. : ill. ; 23 cm |
子書誌情報を非表示
| 1 | v. 1, pt. 2 Electron diffraction and optical diffraction techniques / by B.E.P. Beeston, Robert W. Horne and Roy Markham Amsterdam : North-Holland. - New York : American Elsevier , c1972 |
| 2 | v. 5, pt. 1-2 Staining methods for sectioned material / P.R. Lews and D.P. Knight . X-ray microanalysis in the electron microscope / John A. Chandler Amsterdam : North-Holland , 1977 |
| 3 | v. 5, pt. 2 X-ray microanalysis in the electron microscope / John A. Chandler Amsterdam : North-Holland , c1977 |
| 4 | v. 5, pt. 1 Staining methods for sectioned material / P.R. Lewis and D.P. Knight Amsterdam : North-Holland , c1977 |
書誌詳細を表示
| 本文言語 | 英語 |
|---|---|
| 一般注記 | This series has "laboratory edition (in paperback)" Published: London : Portland Press , 1994-(v.15-) |
| 著者標目 | Glauert, Audrey M. |
| 分 類 | NDLC:ND448 |
| 書誌ID | 1000003530 |
| ISBN | 0720442508 |
| NCID | BA00197962 |