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<図書>
EMIS datareviews series

データ種別 図書
出版者 London ; New York : INSPEC, Institution of Electrical Engineers

子書誌情報を非表示

1 no. 1 Properties of amorphous silicon 2nd ed. - London : INSPEC, Institution of Electrical Engineers , c1989
2 no. 1 Properties of amorphous silicon London ; New York : INSPEC, Institution of Electrical Engineers , c1985
3 no. 2 Properties of gallium arsenide London ; New York : INSPEC, Institution of Electrical Engineers , c1986
4 no. 2 Properties of gallium arsenide 2nd ed. - London ; New York : INSPEC, Institution of Electrical Engineers , c1990
5 no. 3 Properties of mercury cadmium telluride / editors, John Brice and Peter Capper London ; New York : INSPEC, Institution of Electrical Engineers , c1987
6 no. 4 Properties of silicon London ; New York : INSPEC, Institution of Electrical Engineers , c1988
7 no. 6 Properties of indium phosphide London ; New York : INSPEC , c1991
8 no. 7 Properties of aluminium gallium arsenide / edited by Sadao Adachi London : INSPEC, Institution of Electrical Engineers , c1993
9 no. 8 Properties of lattice-matched and strained indium gallium arsenide / edited by Pallab Bhattacharya London : INSPEC , 1993

書誌詳細を表示

本文言語 英語
書誌ID 1000003184
NCID BA01124057