＜図書＞
McGraw-Hill series in software engineering and technology
| データ種別 | 図書 |
|---|---|
| 出版者 | New York ; Tokyo : McGraw-Hill |
子書誌情報を非表示
| 1 | Software reliability : measurement, prediction, application / John D. Musa, Anthony Iannino, Kazuhira Okumoto : pbk. - New York : McGraw-Hill , c1987 |
書誌詳細を表示
| 書誌ID | 1000003202 |
|---|---|
| NCID | BA00143260 |