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RT Book, Whole SR Print DC OPAC T1 Selected papers on analog fault diagnosis / edited by Ruey-Wen Liu T2 Advances in circuits and systems A1 Liu, Ruey-Wen, 1930- YR 1987 FD c1987 VO : pbk SP iii, 143 p. K1 Analog electronic systems -- Testing PB IEEE Press PP New York SN 087942222X LA English (英語) CL LCC:TK7870 CL DC19:621.381/028/5 NO Spine title: Analog fault diagnosis NO Includes bibliographies and index NO "IEEE order number: PPO213-9" -- t.p. verso NO 書誌ID=2000062309; NCID=BA04962740; LK [OPAC]https://www.lib.ntu.ac.jp/opac/opac_link/bibid/2000062309 OL 30