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RT Book, Whole SR Print DC OPAC T1 Accelerated testing : statistical models, test plans and data analysis / Wayne Nelson T2 Wiley series in probability and mathematical statistics A1 Nelson, Wayne, 1936- YR 1990 FD c1990 SP xiv, 601 p. K1 Failure time data analysis K1 Reliability (Engineering) -- Statistical methods K1 Accelerated life testing -- Statistical methods PB Wiley PP New York SN 0471522775 LA English (英語) CL LCC:QA276 CL DC20:519.5 NO "A Wiley-Interscience publication." NO Includes bibliographical references (p. 561-577) and index NO 書誌ID=2000024777; NCID=BA10134812; LK [OPAC]https://www.lib.ntu.ac.jp/opac/opac_link/bibid/2000024777 OL 30