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RT Book, Whole SR Print DC OPAC T1 Electronic test equipment : theory and applications / T.J. Byers A1 Byers, T. J. YR 1987 FD c1987 SP xii, 335 p. K1 Electronic instruments K1 Electronic measurements PB Intertext Publications : McGraw-Hill Book Co. PP New York, N.Y. SN 0070095221 LA English (英語) CL LCC:TK7878.4 CL DC19:621.381 NO Cover title: Electronic test equipment : principles and applications NO Bibliography: p. 315-317 NO Includes index NO 書誌ID=2000062202; NCID=BA06806768; LK [OPAC]https://www.lib.ntu.ac.jp/opac/opac_link/bibid/2000062202 OL 30