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RT Book, Whole SR Print DC OPAC T1 Spectroscopic characterization techniques for semiconductor technology II : January 21-22, 1985, Los Angeles, California / Fred H. Pollak, chairman/editor T2 Proceedings / SPIE -- the International Society for Optical Engineering A1 Pollak, Fred H. A1 Society of Photo-optical Instrumentation Engineers YR 1985 FD c1985 SP vi, 169 p. PB SPIE -- the International Society for Optical Engineering PP Bellingham, Wash. SN 0892525592 LA English (英語) NO 書誌ID=2000062597; NCID=BA23996422; LK [OPAC]https://www.lib.ntu.ac.jp/opac/opac_link/bibid/2000062597 OL 30