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RT Book, Whole SR Print DC OPAC T1 Defects and properties of semiconductors : defect engineering / edited by J. Chikawa, K. Sumino, and K. Wada T2 Advances in solid state technology A1 Chikawa, J. (Junichi), 1930- A1 Sumino, K. (Kōji), 1931- A1 Wada, K. (Kazumi), 1950- A1 Symposium on "Defects and Qualities of Semiconductors" (1984 : Tokyo, Japan) A1 Society of Non-Traditional Technology (Japan) YR 1987 FD c1987 SP vi, 261 p. K1 Semiconductors -- Defects -- Congresses PB KTK Scientific PB D. Reidel PB Distributed in the U.S.A. and Canada by Kluwer Academic PP Tokyo PP Dordrecht ; Boston PP Norwell, MA, U.S.A. SN 9027723524 LA English (英語) CL LCC:QC611.6.D4 CL DC19:621.3815/2 NO Includes bibliographies and index NO "Papers presented at the Symposium on "Defects and Qualities of Semiconductors" which was held in Tokyo on May 17-18, 1984 under the sponsorship of the Society of Non-Traditional Technology"--Pref NO 書誌ID=2000080169; NCID=BA0364350X; LK [OPAC]https://www.lib.ntu.ac.jp/opac/opac_link/bibid/2000080169 OL 30