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RT Book, Whole SR Print DC OPAC T1 Monte Carlo modeling for electron microscopy and microanalysis / David C. Joy T2 Oxford series in optical and imaging sciences A1 Joy, David C., 1943- YR 1995 FD 1995 SP viii, 216 p. K1 Electron microscopy -- Computer simulation K1 Electron probe microanalysis -- Computer simulation K1 Monte Carlo method PB Oxford University Press PP New York SN 0195088743 LA English (英語) CL LCC:QH212.E4 CL DC20:502/.8/25 NO Includes bibliographical references NO 書誌ID=2000084903; NCID=BA25524402; LK [OPAC]https://www.lib.ntu.ac.jp/opac/opac_link/bibid/2000084903 OL 30