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検索キーワード:(標準分類: TK7871.15.S55)
該当件数:6件
Properties of silicon
London ; New York : INSPEC, Institution of Electrical Engineers , c1988. - (EMIS datareviews series ; no. 4)
図書
Polycrystalline silicon for integrated circuit applications / by Ted Kamins
Boston : Kluwer Academic Publishers , c1988. - (The Kluwer international series in engineering and computer science ; SECS 45)
Instabilities in silicon devices : silicon passivation and related instabilities / edited by Gérard Barbottin and André Vapaille
Vol. 1,v. 2. - Amsterdam ; New York : North-Holland. - New York, N.Y., U.S.A. : Sole distributors for the U.S.A. and Canada, Elsevier Science Pub. Co. , 1986-1989
Silicon material preparation and economical wafering methods / edited by Ralph Lutwack and Andrew Morrison
Park Ridge, N.J., USA : Noyes Publications , c1984
Silicon processing : a symposium / sponsored by ASTM Committee F-1 on Electronics, National Bureau of Standards, and Stanford University, San Jose, Calif., 19-22 Jan. 1982 / D.C. Gupta, editor
Philadelphia, Pa. (1916 Race St., Philadelphia 19103) : ASTM , c1983. - (ASTM special technical publication ; 804)
Materials issues in applications of amorphous silicon technology : symposium held April 15-17, 1985, San Francisco, California, U.S.A. / editors, D. Adler, A. Madan, M.J. Thompson
Pittsburgh, Pa. : Materials Research Society , c1985. - (Materials Research Society symposia proceedings ; v. 49)