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検索キーワード:(件名: #Defects)
該当件数:25件
Defects and defect processes in nonmetallic solids / W. Hayes, A.M. Stoneham
New York : Wiley , 1985
図書
Defects in electronic materials : symposium held November 30-December 3, 1987, Boston, Massachusetts, U.S.A. / editors, Michael Stavola, S.J. Pearton, G. Davies
Pittsburgh, Pa. : Materials Research Society , c1988. - (Materials Research Society symposia proceedings ; v. 104)
Defects in glasses : symposium held December 2-4, 1985, Boston, Massachusetts, U.S.A. / editors, Frank L. Galeener, David L. Griscom, Marvin J. Weber
Pittsburgh, Pa. : Materials Research Society , c1986. - (Materials Research Society symposia proceedings ; v. 61)
Proceedings of the 7th International School on Defects in Crystals, Szczyrk, Poland, May 23-30, 1985 / edited by E. Mizera
Singapore : World Scientific , c1987
Point defects in semiconductors / M. Lannoo, J. Bourgoin ; with a foreword by J. Friedel
v. 1 : us - v. 2 : gw. - Berlin ; New York : Springer-Verlag , 1981-1983. - (Springer series in solid-state sciences ; 22, 35)
Defect crystal chemistry and its applications / R.J.D. Tilley
Glasgow : Blackie , c1987
Defect complexes in semiconductor structures : proceedings of the international school held in Mátrafüred, Hungary, September 13-17, 1982 / edited by J. Giber ... [et al.]
: gw,: us. - Berlin ; New York : Springer-Verlag , 1983. - (Lecture notes in physics ; 175)
Infra-red studies of crystal defects / [by] R. C. Newman
: us,: uk. - London : Taylor and Francis. - New York : Barnes & Noble , 1973. - (Taylor and Francis monographs on physics)
An Atlas of polymer damage : surface examination by scanning electron microscope / Lothar Engel ... [et al.] ; translated by M.S. Welling
Munich ; London : Wolfe Science in association with Hanser , 1981
Transition metal impurities in semiconductors : electronic structure and physical properties / K.A. Kikoin, V.N. Fleurov
Singapole : World Scientific , c1994
Crystals, defects and microstructures : modeling across scales / Rob Phillips
: hard,: pbk. - Cambridge, UK ; New York : Cambridge University Press , 2001
Defects and properties of semiconductors : defect engineering / edited by J. Chikawa, K. Sumino, and K. Wada
Tokyo : KTK Scientific. - Dordrecht ; Boston : D. Reidel. - Norwell, MA, U.S.A. : Distributed in the U.S.A. and Canada by Kluwer Academic , c1987. - (Advances in solid state technology)
Transition metal impurities in semiconductors / E.M. Omelʹyanovskii and V.I. Fistulʹ ; translated from the Russian by Albin Tybulewicz
Bristol : Hilger , 1986
Measurement and effects of surface defects and quality of polish : January 21-22, 1985, Los Angeles, California / cosponsor Sira Ltd.--The research association for instrumentation ; Lionel R. Baker, Harold E. Bennett, chairmen/editors
pbk.. - Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering , c1985. - (Proceedings / SPIE -- the International Society for Optical Engineering ; v. 525)
Transport in nonstoichiometric compounds / edited by George Simkovich and Vladimir S. Stubican
New York : Plenum Press , c1985. - (NATO ASI series ; ser. B, Physics ; v. 129)
Creep of crystals : high-temperature deformation processes in metals, ceramics, and minerals / Jean-Paul Poirier
: pbk.. - Cambridge [Cambridgeshire] ; New York : Cambridge University Press , 1985. - (Cambridge earth science series)
Nonstoichiometric compounds / edited by C.R.A. Catlow, W.C. Mackrodt
Westerville, Ohio : American Ceramic Society , c1987. - (Advances in ceramics ; v. 23)
Defects and structural phase transitions / A.P. Levanyuk, A.S. Sigov
New York : Gordon and Breach Science Publishers , c1988. - (Ferroelectricity and related phenomena ; v. 6)
Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, 1985, San Francisco, California, U.S.A. / editors, Noble M. Johnson, Stephen G. Bishop, George D. Watkins
Pittsburgh, Pa. : Materials Research Society , c1985. - (Materials Research Society symposia proceedings ; v. 46)
Defect recognition and image processing in III-V compounds : proceedings of the International Symposium on Defect Recogition and Image Processing in III-V Compounds (DRIP 1985), Montpellier, France, July 2-4, 1985 / edited by J.P. Fillard
Amsterdam ; Tokyo : Elsevier , 1985. - (Materials science monographs ; 31)
Gauge theory and defects in solids / Dominic G.B. Edelen, Dimitris C. Lagoudas
Amsterdam ; Tokyo : North-Holland. - New York, N.Y., U.S.A. : Sole distributors for the U.S.A. and Canada, Elsevier Science Pub. Co. , 1988. - (Mechanics and physics of discrete systems ; v. 1)
Structural analysis of point defects in solids : an introduction to multiple magnetic resonance spectroscopy / Johann-Martin Spaeth, Jürgen R. Niklas, Ralph H. Bartram
: gw,: us. - Berlin ; Tokyo : Springer-Verlag , c1992. - (Springer series in solid-state sciences ; 43)
Point defects and defect interactions in metals / [proceedings of Yamada Conference on Point Defects and Defect Interactions in Metals, held in Kyoto on November 16-20, 1981] ; edited by Jin-Ichi Takamura, Masao Doyama, Michio Kiritani
[Tokyo] : University of Tokyo Press. - Oxford : North-Holland Publishing , 1982
Defect properties and processing of high-technology nonmetallic materials : symposium held December 2-4, 1985, Boston, Massachusetts, U.S.A. / editors, Y. Chen, W.D. Kingery, R.J. Stokes
Pittsburgh, Pa. : Materials Research Society , c1986. - (Materials Research Society symposia proceedings ; v. 60)
Internal friction and ultrasonic attenuation in solids : proceedings of the Sixth International Conference on Internal Friction and Ultrasonic Attenuation in Solids, held July 4-7, 1977, Tokyo / edited by Ryukiti R. Hasiguti, Nobuo Mikoshiba
Tokyo : University of Tokyo Press , c1977