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検索キーワード:(件名: Semiconductors Defects)
該当件数:8件
Point defects in semiconductors / M. Lannoo, J. Bourgoin ; with a foreword by J. Friedel
v. 1 : us - v. 2 : gw. - Berlin ; New York : Springer-Verlag , 1981-1983. - (Springer series in solid-state sciences ; 22, 35)
図書
Transition metal impurities in semiconductors : electronic structure and physical properties / K.A. Kikoin, V.N. Fleurov
Singapole : World Scientific , c1994
Transition metal impurities in semiconductors / E.M. Omelʹyanovskii and V.I. Fistulʹ ; translated from the Russian by Albin Tybulewicz
Bristol : Hilger , 1986
Defect complexes in semiconductor structures : proceedings of the international school held in Mátrafüred, Hungary, September 13-17, 1982 / edited by J. Giber ... [et al.]
: gw,: us. - Berlin ; New York : Springer-Verlag , 1983. - (Lecture notes in physics ; 175)
Defects and properties of semiconductors : defect engineering / edited by J. Chikawa, K. Sumino, and K. Wada
Tokyo : KTK Scientific. - Dordrecht ; Boston : D. Reidel. - Norwell, MA, U.S.A. : Distributed in the U.S.A. and Canada by Kluwer Academic , c1987. - (Advances in solid state technology)
Defects in electronic materials : symposium held November 30-December 3, 1987, Boston, Massachusetts, U.S.A. / editors, Michael Stavola, S.J. Pearton, G. Davies
Pittsburgh, Pa. : Materials Research Society , c1988. - (Materials Research Society symposia proceedings ; v. 104)
Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, 1985, San Francisco, California, U.S.A. / editors, Noble M. Johnson, Stephen G. Bishop, George D. Watkins
Pittsburgh, Pa. : Materials Research Society , c1985. - (Materials Research Society symposia proceedings ; v. 46)
Defect recognition and image processing in III-V compounds : proceedings of the International Symposium on Defect Recogition and Image Processing in III-V Compounds (DRIP 1985), Montpellier, France, July 2-4, 1985 / edited by J.P. Fillard
Amsterdam ; Tokyo : Elsevier , 1985. - (Materials science monographs ; 31)